DocumentCode
1046054
Title
The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the L>M124 Operational Amplifier
Author
Buchner, Stephen ; McMorrow, Dale ; Roche, Nicholas ; Dusseau, Laurent ; Pease, Ron L.
Author_Institution
QSS/PSGS, Seabrook, MD
Volume
55
Issue
6
fYear
2008
Firstpage
3314
Lastpage
3320
Abstract
Shapes of single event transients (SETs) in a linear bipolar circuit (LM124) change with exposure to total ionizing dose (TID) radiation. SETs shape changes are a direct consequence of TID-induced degradation of bipolar transistor gain. A reduction in transistor gain causes a reduction in the drive current of the current sources in the circuit, and it is the lower drive current that most affects the shapes of large amplitude SETs.
Keywords
bipolar analogue integrated circuits; bipolar transistors; operational amplifiers; LM124 operational amplifier; TID-induced degradation; bipolar transistor gain; linear bipolar circuit; low dose-rate ionizing radiation; single event transients; total ionizing dose radiation; Bipolar transistors; Circuits; Electric variables measurement; Error analysis; Ionizing radiation; Operational amplifiers; Optical pulse generation; Pulse amplifiers; Shape measurement; Voltage; Single event transients; total dose effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.2007952
Filename
4723794
Link To Document