DocumentCode
1046067
Title
Probing With Heavy Ions the SET Sensitivity of Linear Devices
Author
Duzellier, Sophie ; Inguimbert, Christophe ; Nuns, Thierry ; Bezerra, Francoise ; Dangla, David
Author_Institution
ONERA-DESP, Toulouse
Volume
55
Issue
6
fYear
2008
Firstpage
3321
Lastpage
3327
Abstract
This paper reports on SET heavy ion data used to estimate the range effects and depth location of sensitive structures of the LM124 operational amplifier. These data are correlated with laser measurements and provide experimental insight into the SET test recommendations and prediction rate methodology.
Keywords
operational amplifiers; LM124 operational amplifier; SET heavy ion data; Absorption; Data analysis; Ion accelerators; Laboratories; Operational amplifiers; Performance evaluation; Satellites; Testing; Vehicles; Volume measurement; Heavy ion; Single Event Transient (SET); linear devices; range effect; sensitive depth;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.2007419
Filename
4723795
Link To Document