• DocumentCode
    1046146
  • Title

    Laser Dose-Rate Simulation to Complement LINAC Discrete Device Data

  • Author

    Nation, S.A. ; Massengill, L.W. ; McMorrow, D. ; Evans, L. ; Straatveit, A.

  • Author_Institution
    Radiat. Effects Group, Vanderbilt Univ., Nashville, TN
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • Firstpage
    3114
  • Lastpage
    3121
  • Abstract
    Laser-induced dose-rate measurements prove useful for extending the range of LINAC data for statistical analysis and for model creation and validation. Results suggest the ability to generate LINAC-equivalent data for dose-rate model development with minimal LINAC correlation. Highly reliable and repeatable data can be produced through the use of a dedicated laser test bench.
  • Keywords
    laser beam applications; linear accelerators; statistical analysis; complement LINAC discrete device data; laser dose-rate simulation; laser test bench; laser-induced dose-rate measurements; linear accelerator; statistical analysis; Circuit simulation; Circuit testing; Cranes; Laser modes; Linear particle accelerator; Optical pulses; Photoconductivity; Pulsed laser deposition; Semiconductor process modeling; X-ray lasers; Discrete devices; dose-rate; laser application;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2006969
  • Filename
    4723801