DocumentCode
104615
Title
Real-Time IGBT Open-Circuit Fault Diagnosis in Three-Level Neutral-Point-Clamped Voltage-Source Rectifiers Based on Instant Voltage Error
Author
Caseiro, Luis M. A. ; Mendes, Andre M. S.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
Volume
62
Issue
3
fYear
2015
fDate
Mar-15
Firstpage
1669
Lastpage
1678
Abstract
This paper presents a real-time diagnostic algorithm for insulated-gate bipolar transistor open-circuit faults in three-level neutral-point-clamped rectifiers. This algorithm is based on the instant voltage error in the converter and requires only signals already available to the control system, avoiding the use of additional hardware. The algorithm is independent from the load and from the used control strategy and provides very fast detection and identification of the fault, with diagnostic times as low as two sample periods (in favorable conditions). Experimental results are presented for the operation of the rectifier with two distinct control and modulation strategies and in different conditions. Results show the algorithm´s speed, effectiveness, and robustness.
Keywords
fault diagnosis; insulated gate bipolar transistors; power bipolar transistors; power convertors; rectifiers; control system; fault detection; fault identification; instant voltage error; insulated-gate bipolar transistor open-circuit faults; real-time IGBT open-circuit fault diagnosis; three-level neutral-point-clamped voltage-source rectifiers; Breakdown voltage; Circuit faults; Fault diagnosis; Insulated gate bipolar transistors; Rectifiers; Switches; Voltage control; Fault detection; fault diagnosis; fault location; multilevel converters; neutral-point-clamped (NPC); rectifiers; reliability; semiconductor device breakdown;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/TIE.2014.2341558
Filename
6861998
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