DocumentCode :
104615
Title :
Real-Time IGBT Open-Circuit Fault Diagnosis in Three-Level Neutral-Point-Clamped Voltage-Source Rectifiers Based on Instant Voltage Error
Author :
Caseiro, Luis M. A. ; Mendes, Andre M. S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
Volume :
62
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
1669
Lastpage :
1678
Abstract :
This paper presents a real-time diagnostic algorithm for insulated-gate bipolar transistor open-circuit faults in three-level neutral-point-clamped rectifiers. This algorithm is based on the instant voltage error in the converter and requires only signals already available to the control system, avoiding the use of additional hardware. The algorithm is independent from the load and from the used control strategy and provides very fast detection and identification of the fault, with diagnostic times as low as two sample periods (in favorable conditions). Experimental results are presented for the operation of the rectifier with two distinct control and modulation strategies and in different conditions. Results show the algorithm´s speed, effectiveness, and robustness.
Keywords :
fault diagnosis; insulated gate bipolar transistors; power bipolar transistors; power convertors; rectifiers; control system; fault detection; fault identification; instant voltage error; insulated-gate bipolar transistor open-circuit faults; real-time IGBT open-circuit fault diagnosis; three-level neutral-point-clamped voltage-source rectifiers; Breakdown voltage; Circuit faults; Fault diagnosis; Insulated gate bipolar transistors; Rectifiers; Switches; Voltage control; Fault detection; fault diagnosis; fault location; multilevel converters; neutral-point-clamped (NPC); rectifiers; reliability; semiconductor device breakdown;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2014.2341558
Filename :
6861998
Link To Document :
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