Title :
Effect of pad and interconnection parasitics on phase delay of transconductance in advanced bipolar transistors
Author :
Lee, Sang-Rim ; Ryum, B.R. ; Kwon, O.-J. ; Lee, Joun-Ho
Author_Institution :
Dept. of Adv. Devices, Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
An analytical expression is developed for determining the accurate phase delay of transconductance or current gain in a small-signal equivalent circuit, including RF probe pad and interconnection parasitics and HBT extrinsic elements. Using this new expression, it is demonstrated that collector resistance, collector interconnection resistance, and pad capacitances have a significant influence on the phase delay.
Keywords :
capacitance; delays; electric resistance; equivalent circuits; heterojunction bipolar transistors; semiconductor device models; solid-state microwave devices; HBT; RF probe pad; Y-parameters; Z-parameters; bipolar transistors; collector interconnection resistance; collector resistance; current gain; interconnection parasitics; pad capacitances; pad parasitics; phase delay; small-signal equivalent circuit; transconductance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19931196