DocumentCode :
1046196
Title :
Effect of pad and interconnection parasitics on phase delay of transconductance in advanced bipolar transistors
Author :
Lee, Sang-Rim ; Ryum, B.R. ; Kwon, O.-J. ; Lee, Joun-Ho
Author_Institution :
Dept. of Adv. Devices, Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Volume :
29
Issue :
20
fYear :
1993
Firstpage :
1797
Lastpage :
1799
Abstract :
An analytical expression is developed for determining the accurate phase delay of transconductance or current gain in a small-signal equivalent circuit, including RF probe pad and interconnection parasitics and HBT extrinsic elements. Using this new expression, it is demonstrated that collector resistance, collector interconnection resistance, and pad capacitances have a significant influence on the phase delay.
Keywords :
capacitance; delays; electric resistance; equivalent circuits; heterojunction bipolar transistors; semiconductor device models; solid-state microwave devices; HBT; RF probe pad; Y-parameters; Z-parameters; bipolar transistors; collector interconnection resistance; collector resistance; current gain; interconnection parasitics; pad capacitances; pad parasitics; phase delay; small-signal equivalent circuit; transconductance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19931196
Filename :
274924
Link To Document :
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