Title :
Origin of magnetic hardness in sputtered thin films of Co-V
Author :
Johansen, T.R. ; Speliotis, D.E.
Author_Institution :
UNIVAC, Division of Sperry Rand Corporation, Minn.
fDate :
9/1/1971 12:00:00 AM
Keywords :
Cobalt-vanadium films; Magnetic recording materials; Cobalt; Coercive force; Crystallization; Hysteresis; Magnetic films; Magnetic recording; Magnetometers; Plasma temperature; Sputtering; Temperature dependence;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1971.1067061