DocumentCode :
1046614
Title :
Experimental evaluation of an MnBi optical memory system
Author :
Aagard, Roger L. ; Schmit, Francis M. ; walters, Wayne ; Di Chen
Author_Institution :
Honeywell Corporate Research Center, Hopkins, Minn.
Volume :
7
Issue :
3
fYear :
1971
fDate :
9/1/1971 12:00:00 AM
Firstpage :
380
Lastpage :
383
Abstract :
An experimental optical memory system is described for evaluating the optical memory characteristics of MnBi films. The preparation procedure for obtaining large uniform films is discussed. These films require about 10 mW of laser power to write 1-μm bits and a coincident field of 600 Oe to erase them. A packing density of 1.5 × 108bit/in2with a typical signal-to-noise ratio of 10 is readily achieved. Large area films have been sample tested and found to be of usable quality over 99.9 percent of the area. Test bits have been repeatedly cycled to the Curie point more than 106times retaining an adequate signal-to-noise ratio.
Keywords :
Magnetooptic memories; Manganese bismuth films; Bismuth; High speed optical techniques; Magnetic films; Magnetic materials; Optical films; Optical saturation; Read-write memory; Signal to noise ratio; Testing; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1971.1067098
Filename :
1067098
Link To Document :
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