DocumentCode
1046965
Title
F. M. Noise measurements on silicon IMPATT oscillators
Author
Swartz, G.A. ; Chiang, Y.S. ; Wen, Cheng P. ; Gonzales, A.
Volume
20
Issue
12
fYear
1973
fDate
12/1/1973 12:00:00 AM
Firstpage
1178
Lastpage
1178
Keywords
Density measurement; Diodes; Electrical resistance measurement; Noise measurement; Noise reduction; Oscillators; Performance analysis; Signal to noise ratio; Silicon; Testing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17849
Filename
1477506
Link To Document