Electrical model for power losses in direct power injection

This paper introduces a study of power losses in a populated board under direct power injection (DPI), used to measure the immunity of integrated circuits to conducted continuous-wave interference. The relative contributions of all loss sources are evaluated, leading to the preeminence of conductive and dielectric losses over radiated ones, and an electrical model of these losses is then suggested. The relationship between losses and impedance profiles is also explained. The validity of the hypotheses formulated in this study is asserted through measurements of radiated losses in a Gigahertz Transverse ElectroMagnetic (GTEM) cell, as well as electrical simulations of a DPI experiment compared with measurements.