• DocumentCode
    1047215
  • Title

    Quasi-three-dimensional perturbation technique, including dielectrics for TWT´s

  • Author

    Greninger, Paul

  • Author_Institution
    Gen. Dynamics, Pomona, CA, USA
  • Volume
    41
  • Issue
    3
  • fYear
    1994
  • fDate
    3/1/1994 12:00:00 AM
  • Firstpage
    445
  • Lastpage
    451
  • Abstract
    A perturbation technique is described for finding phase velocities and coupling impedances in a traveling wave tube for an arbitrary distribution of dielectric material. A model of the sheath helix is presented. Tape helix results will be presented in a separate paper. In all cases presented, without adjusting the dielectric constant, the calculated perturbed phase velocity provided a better answer than the homogeneous dielectric solution, or Naval Research Laboratories´ Small Signal Gain Program. Deviation from theory versus experiment is reported by stating the average sum of the squares difference between theoretical calculations and a second order least squares fit of the measured data. Phase velocities can be calculated for uniform dielectric support rods where the average sum of the squares ⩽1.19×10-5. For cases with notched dielectric support rods phase velocities can be calculated where the average sum of the squares ⩽1.94×10-5. For NRL´s SSG program the average sum of the squares was ⩽1.01×10-4 by comparison. For uniform dielectric support rods the perturbation does not significantly alter the basic shape of the predicted dispersion curve. For notched dielectric support rods applying the perturbation does alter and flatten the shape of the predicted dispersion curve in agreement with experiment
  • Keywords
    dielectric devices; electric impedance; perturbation techniques; travelling-wave-tubes; Small Signal Gain Program; TWT; coupling impedances; dielectrics; dispersion curve; notched dielectric support rods; phase velocities; quasi-3D perturbation technique; sheath helix; traveling wave tube; uniform dielectric support rods; Dielectric constant; Dielectric materials; Dielectric measurements; Impedance; Laboratories; Least squares approximation; Least squares methods; Perturbation methods; Propagation constant; Shape;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.275233
  • Filename
    275233