DocumentCode :
1047347
Title :
A new aperture admittance model for open-ended waveguides
Author :
Stuchly, S.S. ; Sibbald, C.L. ; Anderson, J.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
Volume :
42
Issue :
2
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
192
Lastpage :
198
Abstract :
A new model for the aperture admittance of open-ended waveguide structures radiating into a homogeneous, lossy dielectric is presented. The model is based on the physical and mathematical properties of the driving point admittance of passive, stable one-port networks. The model parameters, which depend upon the geometry of the waveguide and aperture, are determined from a relatively small number of computed admittances. This computed data is obtained by a full-wave moment method solution and, hence, includes the effects of radiation and energy storage in the near field and the evanescent waveguide modes. The accuracy of the numerical method is demonstrated by comparison with measured values. As an example, the model parameters are determined for the coaxial-line geometry. The accuracy of the model, for both the direct and inverse problem, is verified and a rigorous sensitivity and uncertainty analysis is performed. The new model has important applications in the field of dielectric spectroscopy
Keywords :
electric admittance; microwave spectroscopy; waveguide theory; aperture admittance model; coaxial-line geometry; computed admittances; dielectric spectroscopy; driving point admittance; energy storage; evanescent waveguide modes; full-wave moment method solution; geometry; lossy dielectric; model parameters; open-ended waveguides; stable one-port networks; uncertainty analysis; Admittance; Apertures; Computational geometry; Dielectric losses; Dielectric measurements; Energy storage; Mathematical model; Moment methods; Near-field radiation pattern; Solid modeling;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.275246
Filename :
275246
Link To Document :
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