DocumentCode :
1047387
Title :
Effect of DC self-bias on the adhesion of diamond-like carbon deposited on metal tracks by RF-PECVD
Author :
Paul, S.
Author_Institution :
Emerging Technol. Res. Centre, De Montfort Univ., Leicester, UK
Volume :
153
Issue :
4
fYear :
2006
fDate :
7/7/2006 12:00:00 AM
Firstpage :
164
Lastpage :
167
Abstract :
The adhesion and material properties of diamond-like carbon (DLC), deposited by the radio-frequency plasma enhanced chemical vapour deposition technique, can be significantly affected by the substrate material on which the film is deposited and by the substrate topography. These issues have serious implications for applications in electronic devices and hard coating in small areas. We have investigated the adhesion of the diamond-like carbon films to Si substrates characterised by varying degrees of metal coverage. The deposited DLC films were studied at different DC self-bias values. This investigation demonstrates the dependence of the adherence of the DLC films to the metal tracks on the imposed the DC self-bias.
Keywords :
adhesion; diamond-like carbon; elemental semiconductors; plasma CVD coatings; silicon; thin films; DC self-bias; RF-PECVD; Si; diamond-like carbon films; electronic devices; metal tracks; radio-frequency plasma enhanced chemical vapour deposition; silicon substrates; substrate topography;
fLanguage :
English
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2344
Type :
jour
DOI :
10.1049/ip-smt:20060006
Filename :
1659658
Link To Document :
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