DocumentCode :
1047452
Title :
Carrier diffusion degradation of modulation transfer function in charge coupled imagers
Author :
Seib, Dakd H.
Author_Institution :
Aerospace Corporation, Los Angeles, Calif.
Volume :
21
Issue :
3
fYear :
1974
fDate :
3/1/1974 12:00:00 AM
Firstpage :
210
Lastpage :
217
Abstract :
Expressions for the modulation transfer function due to minority carrier diffusion in charge coupled imagers are calculated, following the approach used by Crowell and Labuda. Both front and rear optical illumination of the charge coupled imager are considered; for the rear illumination case interference effects are included. The modulation transfer function for high energy electron excitation is also considered. In all cases, the expressions for the modulation transfer function have been evaluated using typical charge coupled imager parameters. The quantum efficiency predicted by the minority carrier diffusion model is also briefly discussed.
Keywords :
Charge-coupled image sensors; Degradation; Electron optics; Geometrical optics; Lighting; Optical imaging; Quantization; Radiofrequency interference; Spatial resolution; Transfer functions;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1974.17898
Filename :
1477713
Link To Document :
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