Title :
Assessment of a TD-Based Method for Characterization of Antennas
Author :
Cataldo, A. ; Monti, G. ; De Benedetto, E. ; Cannazza, G. ; Tarricone, L. ; Catarinucci, L.
Author_Institution :
Dept. of Innovation Eng., Univ. of Salento, Lecce
fDate :
5/1/2009 12:00:00 AM
Abstract :
Antenna-characterization measurements are traditionally performed in the frequency domain (FD) through a vector network analyzer (VNA) in an anechoic chamber. Nevertheless, the high cost of the required setup strongly limits the possibility of using this approach. Starting from these considerations, a time-domain (TD)-based approach for characterizing antennas without using an anechoic chamber is assessed. As a matter of fact, instruments operating in TD are usually less expensive than VNAs; nevertheless, with appropriate data processing, they provide as much information. Particularly, it is demonstrated that the selection of an optimal time windowing is the main factor that guarantees a high accuracy level in the corresponding FD. The proposed approach leads to the accurate evaluation of the reflection scattering parameter S 11(f) from time-domain reflectometry (TDR) data. The experimental validation is tested on a commercial radio-frequency identification (RFID) reader antenna, and the results are compared with reference VNA measurements performed in an anechoic chamber. The ultimate goal of this paper is to demonstrate that, through calibrated TDR measurements, along with an optimal time windowing, an accurate antenna characterization can be achieved.
Keywords :
anechoic chambers (electromagnetic); antennas; electromagnetic wave reflection; electromagnetic wave scattering; frequency-domain analysis; network analysers; radiofrequency identification; time-domain reflectometry; anechoic chamber; antenna-characterization measurement; commercial radio-frequency identification reader antenna; frequency domain; reflection scattering parameter; time-domain based approach; time-domain reflectometry data; vector network analyzer; Antenna measurements; frequency-domain (FD) analysis; microwave reflectometry; scattering parameters; time-domain reflectometry (TDR);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.2009199