Title :
Improvement of Performance of Amorphous Silicon-Germanium Thin-Film Solar Modules With Large Width P2 Process Technology
Author :
Shui-Yang Lien ; Chia-Hsun Hsu ; Pin Han
Author_Institution :
Dept. of Mater. Sci. & Eng., DaYeh Univ., Changhua, Taiwan
Abstract :
In this paper, the laser power density is varied to increase the P2 laser spot size to investigate its effects on the performance of hydrogenated amorphous silicon-germanium (a-SiGe:H) thin-film solar modules. A larger P2 line spot size is expected to lower the series resistance of the modules, due to the increased contact area between the front and rear electrodes . However, increasing the laser power density faces several problems , which are: 1) damage of the SnO2 front electrode if the used power density exceeds the ablation threshold; 2) reduced quality of a-SiGe:H films; and 3) low spot size increasing rate at high power densities. The first can further lead to the presence of silicon oxide formation at the bottom of the P2 scribes. This paper demonstrates another method to obtain a larger spot size. A multiple P2 line scribing process has been performed to increase the spot size without deteriorating the film´s quality and the module performance. Finally, a 6-P2 linewidth of about 160 $mu $ m leads to a balance between the gain in fill factor and the loss in photocurrent. The optimal module conversion efficiency of 8.82%, which is 8.7% higher than that using a single P2 line process, can be obtained.
Keywords :
amorphous semiconductors; laser materials processing; modules; silicon compounds; solar cells; thin film devices; tin compounds; P2 laser spot size; P2 process technology; SiGe:H; SnO2; ablation threshold; amorphous silicon-germanium module; laser power density; multiple P2 line scribing process; optimal module conversion efficiency; photocurrent; series resistance; silicon oxide formation; thin-film solar module; Density measurement; Electrodes; Laser theory; Power lasers; Power system measurements; Resistance; Amorphous silicon-germanium (a-SiGe:H) module; laser scribing process; multiple P2 line; series resistance; series resistance.;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2379292