DocumentCode
1048072
Title
Temperature fluctuations and flicker noise in p-n junction diodes
Author
Mueller, O.
Author_Institution
General Electric Company, Lynchburg, Va.
Volume
21
Issue
8
fYear
1974
fDate
8/1/1974 12:00:00 AM
Firstpage
539
Lastpage
540
Abstract
A simple and elementary calculation is carried out which shows that microscopic temperature fluctuations produced by the shot-noise nature of the p-n junction diode current can cause 1/f-flicker noise.
Keywords
1f noise; Feedback; Fluctuations; Noise generators; P-n junctions; Semiconductor device noise; Semiconductor diodes; Temperature; Thermal resistance; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1974.17962
Filename
1477777
Link To Document