DocumentCode :
1048473
Title :
The breakdown voltage of double-sided p-n junctions
Author :
Brook, P.
Author_Institution :
Ministry of Defence, Baldock, Herts., England
Volume :
21
Issue :
11
fYear :
1974
fDate :
11/1/1974 12:00:00 AM
Firstpage :
730
Lastpage :
731
Abstract :
The avalanche breakdown voltage of an abrupt double-sided junction is a function only of Neff(the doping obtained from capacitance-voltage analysis) in a material in which the ionization rates for electrons and holes are equal or maintain a constant ratio. This doping parameter, together with the published breakdown voltage data for single-sided junctions, immediately gives the breakdown voltage of the more complex structure.
Keywords :
Admittance; Breakdown voltage; Charge carrier processes; Diodes; Doping; Electric breakdown; Gallium arsenide; Impurities; Ionization; P-n junctions;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1974.18001
Filename :
1477816
Link To Document :
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