DocumentCode :
1048509
Title :
ITO/Homoepitaxial ZnSe/ITO MSM Sensors With Thermal Annealing
Author :
Chang, S.J. ; Lin, T.K. ; Su, Y.-K. ; Chiou, Y.Z. ; Wang, C.K. ; Chang, S.P. ; Chang, C.M. ; Tang, J.J. ; Huang, B.R.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Volume :
6
Issue :
4
fYear :
2006
Firstpage :
945
Lastpage :
949
Abstract :
Indium-tin-oxide/homoepitaxial ZnSe/indium-tin-oxide metal-semiconductor-metal ultraviolet/blue sensors were prepared on the ZnSe substrates. It was found that the Schottky-barrier height became larger and the interface state density became smaller after annealing. With an incident wavelength of 448 nm and an applied bias of 1 V, it was found that the responsivities for the sensors with and without thermal annealing were 0.15 and 0.12 A/W, which corresponds to the quantum efficiencies of 40% and 33.5%, respectively. Furthermore, it was found that the sensors with a smaller noise equivalent power and larger detectivity can be achieved by annealing
Keywords :
Schottky barriers; annealing; indium compounds; metal-semiconductor-metal structures; molecular beam epitaxial growth; ultraviolet detectors; wide band gap semiconductors; zinc compounds; 1 V; 448 nm; ITO; InSnO-ZnSe-InSnO; MSM sensors; Schottky-barrier; metal-semiconductor-metal sensor; metal-semiconductor-metal ultraviolet-blue sensors; molecular beam epitaxy; sensor responsivity; thermal annealing; Annealing; Epitaxial layers; Gallium arsenide; Gallium nitride; Indium tin oxide; Lattices; Photonic band gap; Substrates; Thermal sensors; Zinc compounds; Homoepitaxial; ZnSe; indium–tin–oxide (ITO); metal-semiconductor-metal (MSM) sensor; molecular beam epitaxy (MBE);
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2006.877938
Filename :
1661576
Link To Document :
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