DocumentCode
1048559
Title
II-1 a comparison of two types of buried-channel charge-coupled devices
Author
Brodersen, R.W. ; Tasch, A.F.
Volume
21
Issue
11
fYear
1974
fDate
11/1/1974 12:00:00 AM
Firstpage
737
Lastpage
737
Keywords
Charge coupled devices; Charge measurement; Current measurement; Density measurement; Fabrication; Image storage; Impurities; Instruments; Ion implantation; Noise measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1974.18010
Filename
1477825
Link To Document