DocumentCode :
1048616
Title :
Gold dendrite simulation: root cause determination
Author :
Kersey, Jeff L., Jr. ; Blish, Richard C., II
Author_Institution :
Adv. Micro Devices Inc., Sunnyvale, CA, USA
Volume :
4
Issue :
2
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
189
Lastpage :
191
Abstract :
While dendritic growth for Ag, Sn, and other metals provides jeopardy for the exterior of packaged integrated circuits, we observed Au dendrites inside ceramic packages. The key factors controlling growth kinetics are a combination of bias and two residual chemicals: one hygroscopic component from the die attach material, and gold plating salts. We found dendritic growth rate to be linear with plating salt concentration during laboratory simulations, but were unable to measure the current density dependence. However, the key factor was the presence or absence of residual nonylphenol, tracked down to an inadequate die attach bake schedule. Laboratory simulations produced the same dendrite morphology as seen for failed units. Furthermore, we found dendritic growth would occur only if all three factors were present-bias, nonylphenol, and the plating salts.
Keywords :
ceramic packaging; dendrites; electrochemistry; failure analysis; gold; integrated circuit packaging; Au; Au dendrites; Sn; ceramic packages; dendrite morphology; dendritic growth rate; die attach bake schedule; die attach material; electrochemical processes; failure analysis; gold dendrite simulation; gold plating salts; growth kinetics; hygroscopic component; integrated circuits packaging; plating salt concentration; reliability modeling; residual nonylphenol; root cause determination; Ceramics; Chemicals; Circuit simulation; Density measurement; Gold; Integrated circuit packaging; Kinetic theory; Laboratories; Microassembly; Tin; Failure analysis; electrochemical processes; gold rich; reliability modeling; simulation;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2004.829073
Filename :
1318623
Link To Document :
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