Title :
II-7 PbS MIS devices for charge-coupled infrared imaging applications
Author :
Leonberger, F.J. ; McWhorter, A.L. ; Harman, T.C. ; Hurwitz, C.E.
fDate :
11/1/1974 12:00:00 AM
Keywords :
Current measurement; Dielectric measurements; Image storage; Infrared imaging; Laboratories; MIS devices; MOS capacitors; MOSFETs; Pulse measurements; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.18015
