Title :
Quantitative analysis of integrated optic waveguide spectrometers
Author :
Deri, R.J. ; Kallman, J.S. ; DiJaili, S.P.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
Abstract :
We show how scalar diffraction theory can be used to quantitatively evaluate insertion losses in integrated optic spectrometers based on planar waveguide and etched grating technologies. This approach is applied to optimize the loss-limited spectral operating range of these devices. We also show how limitations in the photolithographic process used for grating definition can result in appreciable spectrometer insertion losses.<>
Keywords :
diffraction gratings; integrated optics; optical losses; optical waveguides; photolithography; spectrometers; etched grating technology; insertion losses; integrated optic waveguide spectrometers; loss-limited spectral operating range; photolithographic process; planar waveguide; quantitative analysis; scalar diffraction theory; spectrometer insertion losses; Etching; Insertion loss; Integrated optics; Optical diffraction; Optical losses; Optical planar waveguides; Optical waveguide theory; Optical waveguides; Planar waveguides; Spectroscopy;
Journal_Title :
Photonics Technology Letters, IEEE
