Title :
IIIB-2 interfacial dopants for dual-dielectric charge-storage (DDC) cells
Author :
Kahng, D. ; Sundburg, W.J. ; Boulin, D.M. ; Ligenza, J.R.
fDate :
11/1/1974 12:00:00 AM
Keywords :
Aluminum; Conductors; Dielectrics; Insulation; Logic circuits; Magnetic memory; Metal-insulator structures; Nonvolatile memory; Semiconductor memory; Thin film transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.18025
