Title :
Automatic linearity and frequency response tests with built-in pattern generator and analyzer
Author :
Dai, Foster Fa ; Stroud, Charles ; Yang, Dayu
Author_Institution :
Dept. Electr. & Comput. Eng., Auburn Univ., AL
fDate :
6/1/2006 12:00:00 AM
Abstract :
We present a built-in self-test (BIST) approach based on a direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. A main contribution of this paper is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) and frequency response, including both phase and gain. The approach has been implemented in Verilog and synthesized into a field-programmable gate array (FPGA), where it was used for functional testing of an actual device under test (DUT) and compared to simulation results
Keywords :
VLSI; analogue integrated circuits; built-in self test; direct digital synthesis; field programmable gate arrays; frequency response; mixed analogue-digital integrated circuits; VLSI testing; Verilog; analog integrated circuits; automatic linearity; built-in pattern generator; built-in self-test; device-under-test; direct digital synthesizer; field-programmable gate array; frequency response; mixed-signal systems; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Frequency response; Linearity; Pattern analysis; Synthesizers; Test pattern generators; Analog integrated circuits; VLSI testing; built-in self-test (BIST); frequency response; inter-modulation; linearity; mixed-signal systems;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2006.878201
