DocumentCode :
1048872
Title :
Wafer-level package interconnect options
Author :
Balachandran, Jayaprakash ; Brebels, S. ; Carchon, G. ; Kuijk, Maarten ; Walter De Raedt ; Nauwelaers, Bart K. J. C. ; Beyne, Eric
Author_Institution :
IMEC VZW, Heverlee
Volume :
14
Issue :
6
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
654
Lastpage :
659
Abstract :
As integrated circuit technology enters the nanometer era, global interconnects are becoming a bottleneck for overall chip performance. In this paper, we show that wafer-level package interconnects are an effective alternative to conventional on-chip global wires. These interconnects behave as LC transmission lines and can be exploited for their near speed of light transmission and low attenuation characteristics. We compare performance measures such as bandwidth, bandwidth density, latency, and power consumption of the package-level transmission lines with conventional on-chip global interconnects for different International Technology Roadmap for Semiconductors (ITRS) technology nodes. Based on these results, we show that package-level interconnects are well suited for power demanding low-latency applications. We also analyze different interconnect options such as memory buses, long inter tile interconnects, clock, and power distribution
Keywords :
integrated circuit interconnections; attenuation characteristics; bandwidth; integrated circuit technology; latency; light transmission; long inter tile interconnects; memory buses; on-chip global interconnects; package-level transmission lines; power consumption; power distribution; wafer-level package interconnects; Bandwidth; Distributed parameter circuits; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Optical attenuators; Power transmission lines; Semiconductor device packaging; Wafer scale integration; Wires; Global interconnects; package; performance metrics; transmission lines;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2006.878229
Filename :
1661608
Link To Document :
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