• DocumentCode
    10489
  • Title

    A 200 °C Safety System at Power-Up of Normally On SiC JFETs Inverters

  • Author

    Risaletto, Damien ; Bergogne, Dominique ; Dubois, Fabien ; Morel, Herve ; Allard, Bruno ; Meuret, Regis

  • Author_Institution
    Laplace Lab., Univ. of Toulouse (INPT, Toulouse, France
  • Volume
    29
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    2338
  • Lastpage
    2344
  • Abstract
    Silicon carbide (SiC) power devices are the only commercialized components to run at high voltage and high temperature. Normally on junction field-effect transistors (JFETs) have lower on-state resistance and lower output capacitance than other SiC switches, which reduces conduction and switching losses. However, normally on power devices induce a short-circuit in voltage-fed inverters (VFI) when the gate driver is not powered prior to the bus supply. This is a power-up limitation that has not received much attention in the literature, especially for safety systems that can be used in an integrated circuit capable of running at elevated temperature. This paper describes an original solution based on SiC JFETs to secure the inverter operation at power-up without gate driver supply for the SiC JFETs. The reliability test of the protection circuit and his impact on the ageing of the JFET of the VFI are also presented. The safety system is capable of running in elevated ambient temperatures. Experimental results have been carried out in a 540 V, 10 A inverter and at ambient temperatures from 27 to 200 °C.
  • Keywords
    JFET circuits; ageing; circuit reliability; invertors; power semiconductor devices; silicon compounds; wide band gap semiconductors; JFET ageing; current 10 A; inverter operation; junction field effect transistor; normally on JFET inverters; normally on power device; power devices; protection circuit; reliability test; safety system; temperature 27 C to 200 C; voltage 540 V; voltage fed inverter; Inductance; Inverters; JFETs; Logic gates; Safety; Silicon carbide; Temperature; Experimental circuit; SiC junction field-effect transistor (JFET); high-temperature power electronics; normally on devices protection; voltage-fed inverter (VFI);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2013.2281669
  • Filename
    6600900