Title :
VI-1 carrier transport in tails of localized states at the Si-SiO2interface
fDate :
11/1/1974 12:00:00 AM
Keywords :
Capacitance; Charge carrier lifetime; Electron traps; Energy capture; Light emitting diodes; Schottky diodes; Spontaneous emission; Tail; Temperature; Zinc oxide;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.18044
