The characterization of magnetic bubble-domain materials with X-ray topography

Author

Stacy, W.T. ; Enz, U.

Author_Institution

Philips Research Laboratory, Eindhoven, The Netherlands

Volume

8

Issue

3

fYear

1972

fDate

9/1/1972 12:00:00 AM

Firstpage

268

Lastpage

272

Abstract

The use of X-ray topography to characterize magnetic bubble materials is discussed. By mapping the crystal strains, the technique reveals defects which can influence the bubble domains and which are not easily observed by other methods. Examples of topographs are given for flux grown iron garnets, Czochralski grown Gd3Ga5O12substrate crystals, and LPE iron garnet layers. The influence of substrate defects on the magnetic film is demonstrated. Transmission topographs of substrate-film combinations have not revealed an intermediate layer of misfit dislocations. The application of X-ray topography to a study of the growth induced anisotropy in magnetic garnets is also described. The topographs reveal a correlation between regions having a particular growth band symmetry and those having a particular noncubic anisotropy.

Keywords

Crystal defects; Defects in crystals; Magnetic bubble materials; X-ray diffraction topography; Crystalline materials; Garnets; Iron; Magnetic anisotropy; Magnetic domains; Magnetic flux; Magnetic materials; Perpendicular magnetic anisotropy; Substrates; Surfaces;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.1972.1067300

Filename

1067300