DocumentCode
1048948
Title
VI-6 study of nonradiative recombination in GaP by deep-level transient spectroscopy
Author
Henry, C.H. ; Lang, D.V.
Volume
21
Issue
11
fYear
1974
fDate
11/1/1974 12:00:00 AM
Firstpage
745
Lastpage
745
Keywords
Capacitance; Charge carrier lifetime; Electron traps; Energy capture; Light emitting diodes; Radiative recombination; Schottky diodes; Spectroscopy; Spontaneous emission; Zinc oxide;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1974.18046
Filename
1477861
Link To Document