Title :
VI-8 evidence of formation of interface states and traps in double-heterostructure lasers under room-temperature CW operation
fDate :
11/1/1974 12:00:00 AM
Keywords :
Aging; Charge carrier lifetime; Degradation; Delay effects; Diodes; Interface states; Laser theory; Masers; P-n junctions; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.18048
