DocumentCode
1049072
Title
Low-frequency creep in CoNiFe films
Author
Bartran, David S. ; Bourne, Henry C., Jr. ; Chow, L.George
Author_Institution
Rice University, Houston, TX
Volume
8
Issue
3
fYear
1972
fDate
9/1/1972 12:00:00 AM
Firstpage
314
Lastpage
316
Abstract
Domain wall motion excited by slow rise-time, bipolar, hard-axis pulses in vacuum deposited CoNiFe films 1500 Å - 2000 Å thick is studied. The results are consistent with those of comparable NiFe films. Furthermore, the wall coercivity is found to be the most significant sample property correlated to the low-frequency creep properties of all the samples.
Keywords
Cobalt-nickel-iron films; Iron-nickel-cobalt films; Magnetic domain walls; Amorphous materials; Amorphous semiconductors; Bulk storage; Coercive force; Creep; Crystallization; Electron beams; Electron optics; Optical films; Solids;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1972.1067311
Filename
1067311
Link To Document