Title :
Low-frequency creep in CoNiFe films
Author :
Bartran, David S. ; Bourne, Henry C., Jr. ; Chow, L.George
Author_Institution :
Rice University, Houston, TX
fDate :
9/1/1972 12:00:00 AM
Abstract :
Domain wall motion excited by slow rise-time, bipolar, hard-axis pulses in vacuum deposited CoNiFe films 1500 Å - 2000 Å thick is studied. The results are consistent with those of comparable NiFe films. Furthermore, the wall coercivity is found to be the most significant sample property correlated to the low-frequency creep properties of all the samples.
Keywords :
Cobalt-nickel-iron films; Iron-nickel-cobalt films; Magnetic domain walls; Amorphous materials; Amorphous semiconductors; Bulk storage; Coercive force; Creep; Crystallization; Electron beams; Electron optics; Optical films; Solids;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1972.1067311
