DocumentCode :
1049123
Title :
High-Frequency Measurement of Communication Apparatus
Author :
Shackelton, W.J. ; Ferguson, J.G.
Author_Institution :
Bell Telephone Laboratories, Inc., New York, N. Y.
fYear :
1927
Firstpage :
519
Lastpage :
527
Abstract :
This paper describes precision high-frequency measurements of a fundamental type, special emphasis being placed on the measuring circuits rather than on the types of apparatus measured. Standards of frequency, resistance, capacitance, and inductance are discussed briefly. Bridge measurements are described for the measurement of frequency, inductance, effective resistance, capacitance, dielectric loss, capacitance balance, and inductance balance, Circuits for the measurement of other high-frequency characteristics such as attenuation, gain, cross-talk, and modulation are included.
fLanguage :
English
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1927.5061385
Filename :
5061385
Link To Document :
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