DocumentCode
1049465
Title
Degradation of the power- and frequency-temperature performance of IMPATT diodes at lower frequencies
Author
Tozer, R.C. ; Hobson, G.S.
Author_Institution
University of Sheffield, Sheffield, England
Volume
22
Issue
3
fYear
1975
fDate
3/1/1975 12:00:00 AM
Firstpage
156
Lastpage
158
Abstract
Investigations of the effect of ambient temperature on the RF power and frequency of
-band p+-n-n+ Si IMPATT diodes at frequencies and temperatures below their optimum conditions show considerable degradation of performance. A simple model is presented to explain these effects in terms of a lower limit to the instantaneous terminal voltage of the diode. Values of diode negative conductance are derived from the measurements and good agreement is obtained with independent measurements. The effects are relevant to both amplitude and frequency stability in wide band applications of IMPATT diodes.
-band p+-n-n+ Si IMPATT diodes at frequencies and temperatures below their optimum conditions show considerable degradation of performance. A simple model is presented to explain these effects in terms of a lower limit to the instantaneous terminal voltage of the diode. Values of diode negative conductance are derived from the measurements and good agreement is obtained with independent measurements. The effects are relevant to both amplitude and frequency stability in wide band applications of IMPATT diodes.Keywords
Breakdown voltage; Circuits; Degradation; Diodes; Electron devices; Probes; Radio frequency; Space charge; Stability; Temperature;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18096
Filename
1477931
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