• DocumentCode
    1049465
  • Title

    Degradation of the power- and frequency-temperature performance of IMPATT diodes at lower frequencies

  • Author

    Tozer, R.C. ; Hobson, G.S.

  • Author_Institution
    University of Sheffield, Sheffield, England
  • Volume
    22
  • Issue
    3
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    156
  • Lastpage
    158
  • Abstract
    Investigations of the effect of ambient temperature on the RF power and frequency of X -band p+-n-n+ Si IMPATT diodes at frequencies and temperatures below their optimum conditions show considerable degradation of performance. A simple model is presented to explain these effects in terms of a lower limit to the instantaneous terminal voltage of the diode. Values of diode negative conductance are derived from the measurements and good agreement is obtained with independent measurements. The effects are relevant to both amplitude and frequency stability in wide band applications of IMPATT diodes.
  • Keywords
    Breakdown voltage; Circuits; Degradation; Diodes; Electron devices; Probes; Radio frequency; Space charge; Stability; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18096
  • Filename
    1477931