DocumentCode :
1049489
Title :
A probabilistic indicator of system stress
Author :
Kirschen, Daniel S. ; Jayaweera, Dilan ; Nedic, Dusko P. ; Allan, Ron N.
Author_Institution :
Univ. of Manchester Inst. of Sci. & Technol., UK
Volume :
19
Issue :
3
fYear :
2004
Firstpage :
1650
Lastpage :
1657
Abstract :
This paper argues that probabilistic techniques give a more reliable indication of the level of stress in a power system and also of its inverse, the level of security. It proposes a technique to calculate a probabilistic indicator of the level of stress in a power system. This technique is based on the establishment of a calibrated scale of reference cases and on the use of correlated sampling in a Monte Carlo simulation. Test results obtained using a large power system are presented.
Keywords :
Monte Carlo methods; power system security; sampling methods; Monte Carlo simulation; power system security; probabilistic techniques; sampling methods; Circuit faults; Poles and towers; Power system reliability; Power system security; Power system simulation; Power systems; Sampling methods; Stress; System testing; Thermal degradation; Monte Carlo methods; power system security; probability; sampling methods;
fLanguage :
English
Journal_Title :
Power Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8950
Type :
jour
DOI :
10.1109/TPWRS.2004.831665
Filename :
1318705
Link To Document :
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