• DocumentCode
    1049489
  • Title

    A probabilistic indicator of system stress

  • Author

    Kirschen, Daniel S. ; Jayaweera, Dilan ; Nedic, Dusko P. ; Allan, Ron N.

  • Author_Institution
    Univ. of Manchester Inst. of Sci. & Technol., UK
  • Volume
    19
  • Issue
    3
  • fYear
    2004
  • Firstpage
    1650
  • Lastpage
    1657
  • Abstract
    This paper argues that probabilistic techniques give a more reliable indication of the level of stress in a power system and also of its inverse, the level of security. It proposes a technique to calculate a probabilistic indicator of the level of stress in a power system. This technique is based on the establishment of a calibrated scale of reference cases and on the use of correlated sampling in a Monte Carlo simulation. Test results obtained using a large power system are presented.
  • Keywords
    Monte Carlo methods; power system security; sampling methods; Monte Carlo simulation; power system security; probabilistic techniques; sampling methods; Circuit faults; Poles and towers; Power system reliability; Power system security; Power system simulation; Power systems; Sampling methods; Stress; System testing; Thermal degradation; Monte Carlo methods; power system security; probability; sampling methods;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2004.831665
  • Filename
    1318705