• DocumentCode
    1049656
  • Title

    The influence of boundary conditions and the bias on amplification from negative differential mobility elements

  • Author

    Grubin, H.L. ; Kaul, Roger

  • Author_Institution
    United Aircraft Research Laboratories, East Hartford, Conn.
  • Volume
    22
  • Issue
    5
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    240
  • Lastpage
    247
  • Abstract
    We demonstrate from a study of the small signal impedance properties of supercritical negative differential mobility (NDM) element that the various modes of device amplification are determined primarily by cathode conditions and the bias. These conclusions are drawn from 1) a detailed analytical investigation where cathode conditions are represented by prespecified values of electric field, and 2) by synthesizing previously published studies. Briefly, it is shown that multiple (bias induced stable-unstable-stable) amplifying states will arise from NDM elements with cathode fields Ecwithin the NDM region. (Here, the different states occur when the device dc current density is, respectively, less than, approximately equal to, or greater than a critical value of current Jc. Jcis determined by Ec.) Single amplifying states will arise from elements with values of Ecthat are either less than the NDM threshold field value, or within the saturated drift velocity region. (In the latter case, time-dependent values for Ecare required.) The study proposes that general features of the space-charge profiles and the cathode conditions may be ascertained from measurements of 1) the small signal device impedance as a function of bias level, and 2) the dc current versus voltage relation.
  • Keywords
    Aircraft; Boundary conditions; Cathodes; Current density; Doping profiles; Electron mobility; Impedance; Laboratories; Semiconductor process modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18114
  • Filename
    1477949