DocumentCode
1049656
Title
The influence of boundary conditions and the bias on amplification from negative differential mobility elements
Author
Grubin, H.L. ; Kaul, Roger
Author_Institution
United Aircraft Research Laboratories, East Hartford, Conn.
Volume
22
Issue
5
fYear
1975
fDate
5/1/1975 12:00:00 AM
Firstpage
240
Lastpage
247
Abstract
We demonstrate from a study of the small signal impedance properties of supercritical negative differential mobility (NDM) element that the various modes of device amplification are determined primarily by cathode conditions and the bias. These conclusions are drawn from 1) a detailed analytical investigation where cathode conditions are represented by prespecified values of electric field, and 2) by synthesizing previously published studies. Briefly, it is shown that multiple (bias induced stable-unstable-stable) amplifying states will arise from NDM elements with cathode fields Ec within the NDM region. (Here, the different states occur when the device dc current density is, respectively, less than, approximately equal to, or greater than a critical value of current Jc . Jc is determined by Ec .) Single amplifying states will arise from elements with values of Ec that are either less than the NDM threshold field value, or within the saturated drift velocity region. (In the latter case, time-dependent values for Ec are required.) The study proposes that general features of the space-charge profiles and the cathode conditions may be ascertained from measurements of 1) the small signal device impedance as a function of bias level, and 2) the dc current versus voltage relation.
Keywords
Aircraft; Boundary conditions; Cathodes; Current density; Doping profiles; Electron mobility; Impedance; Laboratories; Semiconductor process modeling; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18114
Filename
1477949
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