• DocumentCode
    1049900
  • Title

    Functional operations of a high-resistivity n-GaAs diode by trap-controlled domain movement

  • Author

    Tokumaru, Yozo

  • Author_Institution
    Electrotechnical Laboratory, Tanashi, Tokyo
  • Volume
    22
  • Issue
    6
  • fYear
    1975
  • fDate
    6/1/1975 12:00:00 AM
  • Firstpage
    355
  • Lastpage
    357
  • Abstract
    Since a traveling high-field domain in a high-resistivity n-GaAs diode is composed of charges by trapped carriers, it does not easily disappear even after the external conditions to generate it are removed. By using this property of the domain, the diode is operated as a memory device.
  • Keywords
    Annealing; Argon; Density measurement; Diodes; Electron devices; Interface states; MOSFET circuits; Scattering; Surface charging; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18138
  • Filename
    1477973