• DocumentCode
    1050231
  • Title

    Interstage gain proration technique for digital-domain multi-step ADC calibration

  • Author

    Lee, Seung-Hoon ; Song, Bang-Sup

  • Author_Institution
    Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
  • Volume
    41
  • Issue
    1
  • fYear
    1994
  • fDate
    1/1/1994 12:00:00 AM
  • Firstpage
    12
  • Lastpage
    18
  • Abstract
    The interstage gain proration technique greatly simplifies the task of digitally calibrating multi-step analog-to-digital converters (ADC´s) by reducing the number of error measurements and the memory size to store code errors. This technique also makes it feasible to move the calibration hardware into the digital domain, leaving only the switching function in the analog domain. Even though calibrating a multi-step ADC stage-by-stage gives rise to a range mismatch problem between stages, by digitally subtracting prorated interstage gain errors from the latter-stage code errors, the proposed technique corrects nonlinearities resulting from these inaccurate interstage gains. Simulated ADC examples based on a capacitor-array (C-array) multiplying digital-to-analog converter (MDAC) demonstrate a substantial saving in the number of code-error measurements. For example, when calibrating two stages of n 1 and n2 bits each, the resulting number of code-error measurements is given in comparison to the straightforward single-stage calibration
  • Keywords
    analogue-digital conversion; calibration; circuit analysis computing; coding errors; analog-to-digital converters; capacitor-array multiplying ADC; code-error measurements; digital calibration; digital code error calibration; digital-domain multi-step ADC calibration; interstage gain errors; interstage gain proration technique; nonlinearity correction; range mismatch problem; simulation; switching function; Analog-digital conversion; Calibration; Circuits; Computer errors; Digital-analog conversion; Error correction; Error correction codes; Gain measurement; Hardware; Size measurement;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.275666
  • Filename
    275666