• DocumentCode
    1050310
  • Title

    Premature collection mode in IMPATT diodes

  • Author

    Kuvås, Reidar L. ; Schroeder, William E.

  • Author_Institution
    Rockwell International, Thousand Oaks, Calif.
  • Volume
    22
  • Issue
    8
  • fYear
    1975
  • fDate
    8/1/1975 12:00:00 AM
  • Firstpage
    549
  • Lastpage
    558
  • Abstract
    Experimental efficiencies of up to 35.5 percent have been reported for Read-type GaAs diodes, whereas theoretical calculations have predicted an upper limit of approximately 30 percent for the conversion efficiency of IMPATT diodes. The concept of a premature collection mode is shown to resolve this discrepancy by predicting maximum efficiencies close to 40 percent. Premature collection refers to large-signal conditions where the modulation of the drift width is sufficiently large to result in collection of the avalanche current pulse at drift angles smaller than the small-signal angle. It is shown that a discontinuous transition between the IMPATT and the premature collection modes takes place when the drift angle in the small-signal limit is greater than π. Designing the diode for close to punchthrough conditions in small-signal operation extends the practical frequency range for inducing premature collection by avoiding long drift angles and corresponding rapid conductance saturation in the IMPATT mode. The onset of premature collection is accompanied by a substantial increase in power output because of a more favorable drift angle, and in high noise because of the high RF levels involved. The jump in transit angle causes a discontinuous increase in negative conductance. The hysteresis in the tuning characteristic resulting from this discontinuity has been observed experimentally. Noise measures in the range 60-70 dB have been measured and calculated for the premature collection mode compared to 40-50 dB under large-signal conditions for the IMPATT mode. Therefore, the high efficiencies available with the premature collection mode are expected to be usable only in applications where high noise levels can be tolerated.
  • Keywords
    Diodes; Doping profiles; Laboratories; Noise level; Noise measurement; Pulse width modulation; Radio frequency; Silicon; Space vector pulse width modulation; Telephony;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18176
  • Filename
    1478011