DocumentCode :
1050336
Title :
Capacitive probe measurements of dipole domains in InP
Author :
Robson, Peter N. ; Potter, Keith E. ; Majerfeld, Arnoldo
Author_Institution :
University of Sheffield, Sheffield, England
Volume :
22
Issue :
8
fYear :
1975
fDate :
8/1/1975 12:00:00 AM
Firstpage :
569
Lastpage :
575
Abstract :
The capacitive probe used in the past to study the behavior of high-field dipole domains in GaAs is analyzed in detail in order to assess the amount of signal distortion it produces when recording a moving surface potential variation. The results obtained are used to interpret dipole domain measurements in InP. A velocity-field curve for InP between 60 and 160 kV/cm is derived together with information on the variation of the domain shape, domain velocity, peak field, and depletion ratio for different excess domain voltages.
Keywords :
Capacitance; Distortion measurement; Earth; Gallium arsenide; Indium phosphide; Probes; Shape measurement; Signal analysis; Surface resistance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1975.18179
Filename :
1478014
Link To Document :
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