DocumentCode :
1050344
Title :
A nonlinear CCD lumped model and its application to output stage performance analysis
Author :
Tanigawa, Hiroshi ; Ando, Takao
Author_Institution :
Nippon Electric Company, Ltd., Kawasaki-shi, Kanagawa, Japan
Volume :
22
Issue :
8
fYear :
1975
fDate :
8/1/1975 12:00:00 AM
Firstpage :
575
Lastpage :
581
Abstract :
Charge transfer phenomena in CCD (charge-coupled devices) are analyzed using the newly proposed nonlinear lumped model. In this model, carriers are lumped to the center of the potential well and assumed to be transferred unidirectionally from the lump to the adjacent deep Well. The simple equivalent circuit with a nonlinear driftance, which is defined in this paper, is obtained for one stage transfer. Transfer characteristics are in good agreement with results of numerical analysis. Experimentally observed waveforms of CCD output stage could be explained with this nonlinear lumped model.
Keywords :
Charge coupled devices; Charge transfer; Electric variables control; Electrodes; Equivalent circuits; MOS capacitors; Numerical analysis; Performance analysis; Physics; Poisson equations;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1975.18180
Filename :
1478015
Link To Document :
بازگشت