Title :
Silicon-Based Ultra-Wideband Beam-Forming
Author :
Roderick, Jonathan ; Krishnaswamy, Harish ; Newton, Kenneth ; Hashemi, Hossein
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA
Abstract :
Ultra-wideband (UWB) beam-forming, a special class of multiple-antenna systems, allows for high azimuth and depth resolutions in ranging and imaging applications. This paper reports a fully integrated UWB beam-former featuring controllable true time delay and power gain. Several system and circuit level parameters and characterization methods influencing the design and testing of UWB beam-formers are discussed. A UWB beam-former prototype for imaging applications has been fabricated with the potential to yield 20 mm of range resolution and a 7deg angular resolution from a four-element array with 10 mm element spacing. The UWB beam-former accomplishes a 4-bit delay variation for a total of 64 ps of achievable group delay with a 4-ps resolution, a 5-dB gain variation in 1-dB steps, and a worst case -3-dB gain bandwidth of 13 GHz. Overall operation is achieved by the integration of a 3-bit tapped delay trombone-type structure with a 4-ps variable delay resolution, a 1-bit, 32-ps fixed delay coplanar-type structure, and a variable-gain distributed amplifier. The prototype chip fabricated in a 0.18 mum BiCMOS SiGe process occupies 1.6 mm2 of silicon area and consumes 87.5 mW from a 2.5-V supply at the maximum gain setting of 10 dB
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; antenna testing; delays; distributed amplifiers; microwave antenna arrays; silicon; ultra wideband antennas; 0.18 micron; 1 bit; 13 GHz; 2.5 V; 20 mm; 32 ps; 4 bit; 4 ps; 5 dB; 64 ps; 87.5 mW; BiCMOS SiGe process; Si; UWB beam-former; UWB beam-forming; fixed delay coplanar-type structure; four-element array; multiple-antenna systems; power gain; silicon-based ultra-wideband beam-forming; tapped delay trombone-type structure; true time delay; variable delay resolution; variable-gain distributed amplifier; Azimuth; Circuit testing; Delay effects; Design methodology; High-resolution imaging; Image resolution; Integrated circuit yield; Prototypes; System testing; Ultra wideband technology; BiCMOS integrated circuits; delay circuits; phased arrays; radar; wireless communications;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2006.877257