DocumentCode
1050415
Title
Temperature Dependent Characteristics of Nonreach-Through 4H-SiC Separate Absorption and Multiplication APDs for UV Detection
Author
Cha, Ho-Young ; Soloviev, Stanislav ; Zelakiewicz, Scott ; Waldrab, Peter ; Sandvik, Peter M.
Author_Institution
Hongik Univ., Seoul
Volume
8
Issue
3
fYear
2008
fDate
3/1/2008 12:00:00 AM
Firstpage
233
Lastpage
237
Abstract
Silicon carbide (SiC) separate absorption multiplication region avalanche photodiodes (SAM-APDs) for UV detection in harsh environment applications were designed and fabricated. The devices were intentionally designed to operate under nonreach-through conditions in order to eliminate field-induced leakage current. The gain of 2500 and quantum efficiency of ~45% at room temperature were achieved at the wavelength of 290-300 nm for a packaged device with an active area of 1 x 1 mm2. The temperature dependency of the current-voltage characteristics and responsivity was examined in the temperature range from room temperature to 230degC.
Keywords
absorption; avalanche photodiodes; silicon compounds; ultraviolet detectors; wide band gap semiconductors; UV detection; avalanche photodiodes; field-induced leakage current; nonreach-through separate absorption; quantum efficiency; Avalanche photodiodes; Current-voltage characteristics; Dark current; Electromagnetic wave absorption; Ionization; Leakage current; Packaging; Silicon carbide; Temperature dependence; Temperature distribution; Avalanche photodiode; UV; separate absorption multiplication (SAM); silicon carbide;
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2007.913033
Filename
4443124
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