• DocumentCode
    1050415
  • Title

    Temperature Dependent Characteristics of Nonreach-Through 4H-SiC Separate Absorption and Multiplication APDs for UV Detection

  • Author

    Cha, Ho-Young ; Soloviev, Stanislav ; Zelakiewicz, Scott ; Waldrab, Peter ; Sandvik, Peter M.

  • Author_Institution
    Hongik Univ., Seoul
  • Volume
    8
  • Issue
    3
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    237
  • Abstract
    Silicon carbide (SiC) separate absorption multiplication region avalanche photodiodes (SAM-APDs) for UV detection in harsh environment applications were designed and fabricated. The devices were intentionally designed to operate under nonreach-through conditions in order to eliminate field-induced leakage current. The gain of 2500 and quantum efficiency of ~45% at room temperature were achieved at the wavelength of 290-300 nm for a packaged device with an active area of 1 x 1 mm2. The temperature dependency of the current-voltage characteristics and responsivity was examined in the temperature range from room temperature to 230degC.
  • Keywords
    absorption; avalanche photodiodes; silicon compounds; ultraviolet detectors; wide band gap semiconductors; UV detection; avalanche photodiodes; field-induced leakage current; nonreach-through separate absorption; quantum efficiency; Avalanche photodiodes; Current-voltage characteristics; Dark current; Electromagnetic wave absorption; Ionization; Leakage current; Packaging; Silicon carbide; Temperature dependence; Temperature distribution; Avalanche photodiode; UV; separate absorption multiplication (SAM); silicon carbide;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2007.913033
  • Filename
    4443124