Title :
Phase Noise and Jitter in CMOS Ring Oscillators
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA
Abstract :
A simple, physically based analysis illustrate the noise processes in CMOS inverter-based and differential ring oscillators. A time-domain jitter calculation method is used to analyze the effects of white noise, while random VCO modulation most straightforwardly accounts for flicker (1/f) noise. Analysis shows that in differential ring oscillators, white noise in the differential pairs dominates the jitter and phase noise, whereas the phase noise due to flicker noise arises mainly from the tail current control circuit. This is validated by simulation and measurement. Straightforward expressions for period jitter and phase noise enable manual design of a ring oscillator to specifications, and guide the choice between ring and LC oscillator
Keywords :
1/f noise; CMOS integrated circuits; circuit noise; flicker noise; jitter; phase noise; time-domain analysis; voltage-controlled oscillators; white noise; 1-f noise; CMOS inverter-based oscillators; CMOS ring oscillators; LC oscillator; VCO modulation; differential ring oscillators; flicker noise; noise processes; phase noise; tail current control circuit; time-domain jitter calculation method; white noise; 1f noise; CMOS process; Circuit noise; Jitter; Phase noise; Ring oscillators; Tail; Time domain analysis; Voltage-controlled oscillators; White noise;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2006.876206
