Title :
A 2.5- to 3.5-Gb/s Adaptive FIR Equalizer With Continuous-Time Wide-Bandwidth Delay Line in 0.25-

CMOS
Author :
Lin, Xiaofeng ; Liu, Jin ; Lee, Hoi ; Liu, Hao
Author_Institution :
Texas Instrum. Inc., Dallas, TX
Abstract :
This paper presents an adaptive finite impulse response (FIR) equalizer with continuous-time wide-bandwidth delay line in CMOS 0.25-mum process for 2.5-Gb/s to 3.5-Gb/s data communications. To achieve wide bandwidth, fractionally spaced structure is used and an inverter with active-inductor load design is proposed as the delay cell of the tap delay line. Close loop adaptation of the fractionally spaced FIR equalizer is demonstrated using a low-power and area-efficient pulse extraction method as on-chip error detector. Measurement results show that the proposed adaptive equalizer achieves over 75% horizontal eye opening when the channel loss at the half-data-rate frequency varies from 4 dB to 21 dB at 2.5-Gb/s data rate. At 3.5-Gb/s data rate, the equalizer achieves 68% horizontal eye opening when the channel loss is about 9.3 dB at the half-data-rate frequency. The adaptive equalizer including the FIR filter and the error detector occupies 0.095 mm2 die area and dissipates 95 mW at 2.5-Gb/s data rate from 2.5-V voltage supply
Keywords :
CMOS integrated circuits; adaptive equalisers; continuous time filters; delay lines; error detection; 0.25 micron; 2.5 V; 2.5 to 3.5 Gbit/s; 95 mW; CMOS process; FIR filter; active-inductor load design; adaptive FIR equalizer; adaptive equalizer; adaptive finite impulse response equalizer; channel loss; continuous-time wide-bandwidth delay line; data communications; delay cell; half-data-rate frequency; on-chip error detector; pulse extraction method; tap delay line; Adaptive equalizers; Bandwidth; CMOS process; Data communication; Data mining; Delay lines; Detectors; Finite impulse response filter; Frequency; Inverters; Adaptive equalizers; CMOS analog integrated circuits; continuous time filters; data communication;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2006.875302