• DocumentCode
    1050827
  • Title

    Plated-wire memories--Problems and progress

  • Author

    Fedde, George A.

  • Author_Institution
    Sperry Rand Corporation, Blue Bell, Pa
  • Volume
    8
  • Issue
    3
  • fYear
    1972
  • fDate
    9/1/1972 12:00:00 AM
  • Firstpage
    620
  • Lastpage
    624
  • Abstract
    Plated magnetic film wire memory elements must remain cost competitive with alternate memory elements or they will disappear from the commercial market. Substantial progress toward this goal is continuing in four areas. 1) High capacity memory modules with 5000 bits per square inch, or more, are being developed. 2) Use of new tests and substrate preparation processes make possible 50 bits per inch of wire on 2.5 mil diameter wire. 3) Plating process improvements make stable, repeatable high yield possible. Peak yield of 90% to 95% and large volume yield of 45% to 55% have been achieved. 4) Better understanding and new tests for disturb phenomena avoid design and performance problems. Automatic memory array test equiment provides economical high precision testing.
  • Keywords
    Plated-wire memories; Automatic testing; Circuit testing; Costs; Fabrication; Ferrites; Integrated circuit measurements; Integrated circuit yield; Magnetic films; Substrates; Wire;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1972.1067463
  • Filename
    1067463