DocumentCode
1050827
Title
Plated-wire memories--Problems and progress
Author
Fedde, George A.
Author_Institution
Sperry Rand Corporation, Blue Bell, Pa
Volume
8
Issue
3
fYear
1972
fDate
9/1/1972 12:00:00 AM
Firstpage
620
Lastpage
624
Abstract
Plated magnetic film wire memory elements must remain cost competitive with alternate memory elements or they will disappear from the commercial market. Substantial progress toward this goal is continuing in four areas. 1) High capacity memory modules with 5000 bits per square inch, or more, are being developed. 2) Use of new tests and substrate preparation processes make possible 50 bits per inch of wire on 2.5 mil diameter wire. 3) Plating process improvements make stable, repeatable high yield possible. Peak yield of 90% to 95% and large volume yield of 45% to 55% have been achieved. 4) Better understanding and new tests for disturb phenomena avoid design and performance problems. Automatic memory array test equiment provides economical high precision testing.
Keywords
Plated-wire memories; Automatic testing; Circuit testing; Costs; Fabrication; Ferrites; Integrated circuit measurements; Integrated circuit yield; Magnetic films; Substrates; Wire;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1972.1067463
Filename
1067463
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