Title :
An 80 nm 4 Gb/s/pin 32 bit 512 Mb GDDR4 Graphics DRAM With Low Power and Low Noise Data Bus Inversion
Author :
Bae, Seung-Jun ; Park, Kwang-Il ; Ihm, Jeong-Don ; Song, Ho-Young ; Lee, Woo-Jin ; Kim, Hyun-Jin ; Kim, Kyoung-Ho ; Park, Yoon-Sik ; Park, Min-Sang ; Lee, Hong-Kyong ; Bang, Sam-Young ; Moon, Gil-Shin ; Hwang, Seok-Won ; Cho, Young-Chul ; Hwang, Sang-Jun
Author_Institution :
Samsung Electron., Gyeonggu-Do
Abstract :
4 Gb/s/pin 32 bit 512 Mb GDDR4 (Graphics Double Data Rate 4) SDRAM was implemented by using an 80 nm CMOS process. It employs a data bus inversion (DBI) coding to overcome the bottleneck of a parallel single-ended signaling, a power consumption of I/O, power supply noise, and crosstalk. Both DBI AC and DC modes are combined to a single circuit by eliminating the feedback path of a conventional DBI AC circuit while achieving high-speed operation. The proposed DBI circuit uses an analog majority voter insensitive to mismatch for small area and delay. Ronmiddot tuning further improves the voltage and time margin by adding a user-supplied offset to auto-calibrated Ronmiddot. In addition, a dual duty cycle corrector (DCC) is used to reduce duty error and jitter by averaging two outputs of two DCCs. Measured results show that DBI DC coding reduces the peak-to-peak jitter from 65.5 ps to 44.5 ps and the voltage fluctuation from 183 mV to 115 mV at the data rate of 4 Gb/s with the 2 V.
Keywords :
CMOS memory circuits; DRAM chips; computer graphic equipment; low-power electronics; CMOS process; DBI AC circuit; GDDR4 graphics DRAM; SDRAM; bit rate 4 Gbit/s; dual duty cycle corrector; graphics double data rate 4; low noise data bus inversion; low power data bus inversion; parallel single-ended signaling; peak-to-peak jitter; size 80 nm; storage capacity 512 Mbit; CMOS process; Circuit noise; Crosstalk; Energy consumption; Feedback circuits; Graphics; Jitter; Power supplies; Random access memory; SDRAM; ${rm V}_{rm ref}$ calibration; Analog majority voter; data bus inversion; duty cycle corrector; graphics DRAM; single-ended signaling;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2007.908002