DocumentCode
1051125
Title
Noise in MOS bucket-brigade devices
Author
Buss, Dennis D. ; Bailey, Walter H. ; Eversole, William L.
Author_Institution
Texas Instruments, Incorporated, Dallas, Tex.
Volume
22
Issue
11
fYear
1975
fDate
11/1/1975 12:00:00 AM
Firstpage
977
Lastpage
981
Abstract
Previous calculations of noise in bucket-brigade devices (BBD´s) have ignored subthreshold leakage current even though BBD´s operate in the subthreshold region over most of their useful frequency range. In this work, subthreshold leakage is included in the calculation, but surprisingly, it makes little difference in the end result. The noise spectrum in p-channel BBD´s is measured and agrees well with the calculated noise spectrum which includes the effects of correlation between noise packets, imperfect charge transfer efficiency, and output circuitry.
Keywords
Charge transfer; Circuit noise; Clocks; Density measurement; Equations; Frequency; Low-frequency noise; MOSFET circuits; Noise measurement; Subthreshold current;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18256
Filename
1478091
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