DocumentCode :
1051125
Title :
Noise in MOS bucket-brigade devices
Author :
Buss, Dennis D. ; Bailey, Walter H. ; Eversole, William L.
Author_Institution :
Texas Instruments, Incorporated, Dallas, Tex.
Volume :
22
Issue :
11
fYear :
1975
fDate :
11/1/1975 12:00:00 AM
Firstpage :
977
Lastpage :
981
Abstract :
Previous calculations of noise in bucket-brigade devices (BBD´s) have ignored subthreshold leakage current even though BBD´s operate in the subthreshold region over most of their useful frequency range. In this work, subthreshold leakage is included in the calculation, but surprisingly, it makes little difference in the end result. The noise spectrum in p-channel BBD´s is measured and agrees well with the calculated noise spectrum which includes the effects of correlation between noise packets, imperfect charge transfer efficiency, and output circuitry.
Keywords :
Charge transfer; Circuit noise; Clocks; Density measurement; Equations; Frequency; Low-frequency noise; MOSFET circuits; Noise measurement; Subthreshold current;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1975.18256
Filename :
1478091
Link To Document :
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