• DocumentCode
    1051244
  • Title

    Two-dimensional analysis of triode-like operation of junction gate FET´s

  • Author

    Yamaguchi, K. ; Toyabe, T. ; Kodera, H.

  • Author_Institution
    Hitachi, Ltd., Tokyo, Japan
  • Volume
    22
  • Issue
    11
  • fYear
    1975
  • fDate
    11/1/1975 12:00:00 AM
  • Firstpage
    1047
  • Lastpage
    1049
  • Abstract
    Triode-like operation of junction gate FET´s is analyzed by two-dimensional computer simulation. Triode-like characteristics are shown to appear with the channel normally off and the depletion layer reaching the drain electrode. Triode-like current arises from carrier injection from the source electrode into the depleted region. Triode-like operation is achieved without intrinsic material.
  • Keywords
    Computer simulation; Electrodes; Electron mobility; Electron tubes; FETs; Neodymium; Power amplifiers; Solid state circuits; Uncertainty; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18268
  • Filename
    1478103