DocumentCode
1051244
Title
Two-dimensional analysis of triode-like operation of junction gate FET´s
Author
Yamaguchi, K. ; Toyabe, T. ; Kodera, H.
Author_Institution
Hitachi, Ltd., Tokyo, Japan
Volume
22
Issue
11
fYear
1975
fDate
11/1/1975 12:00:00 AM
Firstpage
1047
Lastpage
1049
Abstract
Triode-like operation of junction gate FET´s is analyzed by two-dimensional computer simulation. Triode-like characteristics are shown to appear with the channel normally off and the depletion layer reaching the drain electrode. Triode-like current arises from carrier injection from the source electrode into the depleted region. Triode-like operation is achieved without intrinsic material.
Keywords
Computer simulation; Electrodes; Electron mobility; Electron tubes; FETs; Neodymium; Power amplifiers; Solid state circuits; Uncertainty; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18268
Filename
1478103
Link To Document