• DocumentCode
    1051283
  • Title

    A 1-V CMOS Current Reference With Temperature and Process Compensation

  • Author

    Bendali, Abdelhalim ; Audet, Yves

  • Author_Institution
    Ecole Polytechnique de Montreal, Montreal
  • Volume
    54
  • Issue
    7
  • fYear
    2007
  • fDate
    7/1/2007 12:00:00 AM
  • Firstpage
    1424
  • Lastpage
    1429
  • Abstract
    A 1-V current reference fabricated in a standard CMOS process is described. Temperature compensation is achieved from a bandgap reference core using a transimpedance amplifier in order to generate an intermediate voltage reference, VREF. This voltage applied to the gate of a carefully sized nMOS output transistor provides a reference drain current, IREF , nearly independent of temperature by mutual compensation of mobility and threshold voltage variations. The circuit topology allows for compensation of threshold voltage variation due to process parameters as well. The current reference has been fabricated in a standard 0.18-mum CMOS process. Results from nineteen samples measured over a temperature range of 0degC to 100degC , showed values of IREF of 144.3 muA plusmn 7% and VREF of 610.9 mV plusmn 2% due to the combined effect of temperature and process variations.
  • Keywords
    CMOS analogue integrated circuits; low-power electronics; reference circuits; CMOS current reference; bandgap reference; intermediate voltage reference; low voltage; mobility variation; process compensation; reference drain current; size 0.18 mum; temperature 0 C to 100 C; temperature compensation; threshold voltage variation; transimpedance amplifier; voltage 1 V; CMOS process; Circuits; Current measurement; Low voltage; MOS devices; MOSFETs; Photonic band gap; Temperature distribution; Temperature measurement; Threshold voltage; CMOS; current reference; low voltage; process and temperature compensation; transimpedance amplifier;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2007.900176
  • Filename
    4268396