DocumentCode :
1051290
Title :
True Random Number Generator With a Metastability-Based Quality Control
Author :
Tokunaga, Carlos ; Blaauw, David ; Mudge, Trevor
Author_Institution :
Univ. of Michigan, Ann Arbor
Volume :
43
Issue :
1
fYear :
2008
Firstpage :
78
Lastpage :
85
Abstract :
We present a metastability-based true random number generator that achieves high entropy and passes NIST randomness tests. The generator grades the probability of randomness regardless of the output bit value by measuring the metastable resolution time. The system determines the original random noise level at the time of metastability and tunes itself to achieve a high probability of randomness. Dynamic control enables the system to respond to deterministic noise and a qualifier module grades the individual metastable events to produce a high-entropy random bit-stream. The grading module allows the user to trade off output bit-rate with the quality of the bit-stream. A fully integrated true random number generator was fabricated in a 0.13 mum bulk CMOS technology with an area of 0.145 mm2.
Keywords :
CMOS integrated circuits; entropy; random noise; random number generation; NIST randomness test; bulk CMOS technology; deterministic noise; high-entropy random bit-stream; metastability-based quality control; random noise level; randomness probability; size 0.13 mum; true random number generator; CMOS technology; Control systems; Entropy; Metastasis; NIST; Noise level; Quality control; Random number generation; Testing; Time measurement; Entropy; random noise; random number generation;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.910965
Filename :
4443211
Link To Document :
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