• DocumentCode
    1051290
  • Title

    True Random Number Generator With a Metastability-Based Quality Control

  • Author

    Tokunaga, Carlos ; Blaauw, David ; Mudge, Trevor

  • Author_Institution
    Univ. of Michigan, Ann Arbor
  • Volume
    43
  • Issue
    1
  • fYear
    2008
  • Firstpage
    78
  • Lastpage
    85
  • Abstract
    We present a metastability-based true random number generator that achieves high entropy and passes NIST randomness tests. The generator grades the probability of randomness regardless of the output bit value by measuring the metastable resolution time. The system determines the original random noise level at the time of metastability and tunes itself to achieve a high probability of randomness. Dynamic control enables the system to respond to deterministic noise and a qualifier module grades the individual metastable events to produce a high-entropy random bit-stream. The grading module allows the user to trade off output bit-rate with the quality of the bit-stream. A fully integrated true random number generator was fabricated in a 0.13 mum bulk CMOS technology with an area of 0.145 mm2.
  • Keywords
    CMOS integrated circuits; entropy; random noise; random number generation; NIST randomness test; bulk CMOS technology; deterministic noise; high-entropy random bit-stream; metastability-based quality control; random noise level; randomness probability; size 0.13 mum; true random number generator; CMOS technology; Control systems; Entropy; Metastasis; NIST; Noise level; Quality control; Random number generation; Testing; Time measurement; Entropy; random noise; random number generation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2007.910965
  • Filename
    4443211